A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale

Titel in Übersetzung: A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

48 Zitate (Scopus)

Titel in Übersetzung	A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
Originalsprache	Englisch
Seiten (von - bis)	4835-4844
Fachzeitschrift	Acta materialia
Jahrgang	55
Publikationsstatus	Veröffentlicht - 2007

Dieses zitieren

@article{5da523d5012342689b5fa685385a9d3d,

title = "A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale",

author = "Stefan Massl and Jozef Keckes and Reinhard Pippan",

year = "2007",

language = "English",

volume = "55",

pages = "4835--4844",

journal = "Acta materialia",

issn = "1359-6454",

publisher = "Acta Materialia Inc",

}