Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

Titel in Übersetzung: Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	Microscopy Conference (MC2011) - Kiel, Deutschland Dauer: 28 Aug. 2011 → 2 Sept. 2011

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@conference{b690cef19b404938951b626620778e49,

title = "Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy",

author = "Zaoli Zhang and Rostislav Daniel and Gerhard Dehm and Christian Mitterer",

year = "2011",

language = "English",

note = "Microscopy Conference (MC2011) ; Conference date: 28-08-2011 Through 02-09-2011",

}