Abstract
Contact resistance is a multifaceted challenge faced by the 2D materials community. Large Schottky barrier heights and gap-state pinning are active obstacles that require an integrated approach to achieve the development of high-performance electronic devices based on 2D materials. In this work, we present semiconducting PtSe2 field effect transistors with all-van-der-Waals electrode and dielectric interfaces. We use graphite contacts, which enable high ION/IOFF ratios up to 109 with currents above 100 μA μm-1 and mobilities of 50 cm2 V-1 s-1 at room temperature and over 400 cm2 V-1 s-1 at 10 K. The devices exhibit high stability with a maximum hysteresis width below 36 mV nm-1. The contact resistance at the graphite-PtSe2 interface is found to be below 700 Ω μm. Our results present PtSe2 as a promising candidate for the realization of high-performance 2D circuits built solely with 2D materials.
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 6529-6537 |
| Seitenumfang | 9 |
| Fachzeitschrift | Nano Letters |
| Jahrgang | 24.2024 |
| Ausgabenummer | 22 |
| DOIs | |
| Publikationsstatus | Veröffentlicht - 24 Mai 2024 |
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Publisher Copyright:© 2024 The Authors. Published by American Chemical Society
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