Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations

Renell Dubosq, B Gault, C Hatzoglou, K Schweinar, F Vurpillot, A Rogowitz, Gerd Rantitsch, D Schneider

Publikation: Beitrag in FachzeitschriftArtikelForschungBegutachtung

1 Zitat (Scopus)


The spatial correlation between defects in crystalline materials and trace element segregation plays a fundamental role in determining the physical and mechanical properties of a material, which is particularly important in naturally deformed materials. Herein, we combine electron backscatter diffraction, electron channelling contrast imaging, scanning transmission electron microscopy and atom probe tomography on a naturally occurring metal sulphide in an attempt to document mechanisms of element segregation in a brittle-dominated deformation regime. Within APT reconstructions, features with a high point density comprising O-rich discs stacked over As-rich spherules are observed. The combined microscopy data allow us to interpret these as nanoscale fluid inclusions. Our observations are confirmed by simulated APT experiments of core-shell particles with a core exhibiting a very low evaporation field and the shell emulating a segregated layer at the inclusion interface. Our data has significant trans-disciplinary implications to the geosciences, the material sciences, and analytical microscopy.

Frühes Online-Datum5 Aug. 2020
PublikationsstatusVeröffentlicht - Nov. 2020

Bibliographische Notiz

Funding Information:
This project was funded by a Mitacs Globalink award and CCEM seed grant (to RD) and NSERC grant (to DAS). We greatly appreciated discussions with Tyler Blum (UW-Madison) and Paraskevas Kontis (MPIE, Düsseldorf). Andreas Sturm and Uwe Tezins are thanked for their training and support of the APT and FIB facilities at MPIE. We thank Lola Lilensten (MPIE, Düsseldorf) for assistance during APT experiments, and Hui Yuan (CCEM, Hamilton) and Natalie Hamada (CCEM Hamilton) for their assistance at on PFIB and STEM instruments at CCEM. Two anonymous reviewers and Angus Kirkland provided valuable comments during the review process.

Publisher Copyright:
© 2020 Elsevier B.V.

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