Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems

Titel in Übersetzung: Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband

Titel in Übersetzung	Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems
Originalsprache	Englisch
Titel	10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting
Seiten	64-67
Publikationsstatus	Veröffentlicht - 2010

Dieses zitieren

@inproceedings{edf721a11e164ef382ce3a616c5cc2c0,

title = "Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems",

author = "Andreas Weber and Katharina Resch and Christian Teichert",

year = "2010",

language = "English",

pages = "64--67",

booktitle = "10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting",

}