Characterization and modeling of a typical curing material for photoresist films

Chongnan Peng, Matthias Morak, Andreas Thalhamer, Mario Gschwandl, Peter Fuchs, Qi Tao, Thomas Krivec, Thomas Antretter, Miguel Angel Celigueta

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in Konferenzband

OriginalspracheEnglisch
Titel2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2022
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
ISBN (elektronisch)9781665458368
DOIs
PublikationsstatusVeröffentlicht - 2022
Veranstaltung23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2022 - St Julian, Malta
Dauer: 25 Apr. 202227 Apr. 2022

Publikationsreihe

Name2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2022

Konferenz

Konferenz23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2022
Land/GebietMalta
OrtSt Julian
Zeitraum25/04/2227/04/22

Bibliographische Notiz

Funding Information:
The research work was performed within the COMET-project „MODELING AND SIMULATION OF LASER-CONTROLLED PROCESS AND MANUFACTURING TECHNIQUES“ (project-no.: VII-2.06) at the Polymer Competence Center Leoben GmbH (PCCL, Austria) within the framework of the COMET-program of the Federal Ministry for Climate Action, Environment, Energy, Mobility, Innovation and Technology and the Federal Ministry for Digital and Economic Affairs with contributions by Montanuniversitaet Leoben (Chair of Mechanics), International Center for Numerical Methods in Engineering (CIMNE) and AT&S Austria Technologie & Systemtechnik AG. The PCCL is funded by the Austrian Government and the State Governments of Styria, Lower Austria and Upper Austria.

Publisher Copyright:
© 2022 IEEE.

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