Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

Titel in Übersetzung: Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

H. Gabrisch, Svea Mayer, F. Pyczak, M. Rackel, U. Lorenz, N. Schell, A. Schreyer, A. Stark

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2013
Veranstaltung	Microscopy Conference - Regensburg, Deutschland Dauer: 25 Aug. 2013 → 30 Aug. 2013

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@conference{32cedab59a3e4a31bb6af6086900fc71,

title = "Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging",

author = "H. Gabrisch and Svea Mayer and F. Pyczak and M. Rackel and U. Lorenz and N. Schell and A. Schreyer and A. Stark",

year = "2013",

language = "English",

note = "Microscopy Conference ; Conference date: 25-08-2013 Through 30-08-2013",

}