Characterization of single ZnO nanorods by conductive atomic force microscopy

Titel in Übersetzung: Characterization of single ZnO nanorods by conductive atomic force microscopy

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Characterization of single ZnO nanorods by conductive atomic force microscopy
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2009
Veranstaltung	ÖPG Jahrestagung 2009 - Innsbruck Dauer: 2 Sept. 2009 → 4 Sept. 2009

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@conference{c07a2fceb521430e86162add4db8c4a4,

title = "Characterization of single ZnO nanorods by conductive atomic force microscopy",

author = "Markus Kratzer and Igor Beinik and Christian Teichert and Lin Wang and Gerhard Brauer and Wolfgang Anwand",

year = "2009",

language = "English",

note = "{\"O}PG Jahrestagung ; Conference date: 02-09-2009 Through 04-09-2009",

}