Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

Titel in Übersetzung: Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

Paloma Tejedor, Laura Díez-Merino, Igor Beinik, Christian Teichert

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

11 Zitate (Scopus)

Titel in Übersetzung	Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
Originalsprache	Englisch
Seiten (von - bis)	123103-1-123103-3
Fachzeitschrift	Applied physics letters
Jahrgang	95
DOIs	https://doi.org/10.1063/1.3232234
Publikationsstatus	Veröffentlicht - 2009

Zugriff auf Dokument

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T1 - Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

AU - Tejedor, Paloma

AU - Díez-Merino, Laura

AU - Beinik, Igor

AU - Teichert, Christian

PY - 2009

Y1 - 2009

U2 - 10.1063/1.3232234

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JO - Applied physics letters

JF - Applied physics letters

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