Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

Titel in Übersetzung: Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

11 Zitate (Scopus)

Titel in Übersetzung	Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
Originalsprache	Englisch
Seiten (von - bis)	123103-1-123103-3
Fachzeitschrift	Applied physics letters
Jahrgang	95
DOIs	https://doi.org/10.1063/1.3232234
Publikationsstatus	Veröffentlicht - 2009

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title = "Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)",

author = "Paloma Tejedor and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",

year = "2009",

doi = "10.1063/1.3232234",

language = "English",

volume = "95",

pages = "123103--1--123103--3",

journal = "Applied physics letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

AU - Tejedor, Paloma

AU - Díez-Merino, Laura

AU - Beinik, Igor

AU - Teichert, Christian

PY - 2009

Y1 - 2009

U2 - 10.1063/1.3232234

DO - 10.1063/1.3232234

M3 - Article

SN - 0003-6951

VL - 95

SP - 123103-1-123103-3

JO - Applied physics letters

JF - Applied physics letters

ER -