Conventional TEM Investigation of the FIB Damage in Copper

Titel in Übersetzung: Conventional TEM Investigation of the FIB Damage in Copper

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband

Titel in Übersetzung	Conventional TEM Investigation of the FIB Damage in Copper
Originalsprache	Englisch
Titel	Microscopy Conference, International Forum for Advanced Microscopy
Seiten	100-101
Publikationsstatus	Veröffentlicht - 2007

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@inproceedings{7bb17192d11a4904b5ad1ff05b68f4c6,

title = "Conventional TEM Investigation of the FIB Damage in Copper",

author = "Daniel Kiener and Thomas J{\"o}rg and Martin Rester and Christian Motz and Gerhard Dehm",

year = "2007",

language = "English",

pages = "100--101",

booktitle = "Microscopy Conference, International Forum for Advanced Microscopy",

}