Conventional TEM investigation of the FIB damage in copper

Titel in Übersetzung: Conventional TEM investigation of the FIB damage in copper

Daniel Kiener, Thomas Jörg, Martin Rester, Christian Motz, Gerhard Dehm

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

Titel in Übersetzung	Conventional TEM investigation of the FIB damage in copper
Originalsprache	Englisch
Seiten (von - bis)	100-101
Fachzeitschrift	Microscopy and microanalysis
Jahrgang	13
Publikationsstatus	Veröffentlicht - 2007

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@article{a1370f9f9b584e858a6b50d8460477d5,

title = "Conventional TEM investigation of the FIB damage in copper",

author = "Daniel Kiener and Thomas J{\"o}rg and Martin Rester and Christian Motz and Gerhard Dehm",

year = "2007",

language = "English",

volume = "13",

pages = "100--101",

journal = "Microscopy and microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}