Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films

Thomas Glechner; S. Lang; R. Hahn; Markus Alfreider; Vincent Moraes; Daniel Primetzhofer; Jürgen Ramm; S. Kolozsvári; Daniel Kiener; Helmut Riedl

doi:10.1016/j.surfcoat.2020.126212

Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films

Thomas Glechner, S. Lang, R. Hahn, Markus Alfreider, Vincent Moraes, Daniel Primetzhofer, Jürgen Ramm, S. Kolozsvári, Daniel Kiener, Helmut Riedl

Lehrstuhl für Materialphysik (430)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

5 Zitate (Scopus)

47 Downloads (Pure)

Originalsprache	Englisch
Aufsatznummer	126212
Seitenumfang	8
Fachzeitschrift	Surface and Coatings Technology
Jahrgang	399.2020
Ausgabenummer	15 October
DOIs	https://doi.org/10.1016/j.surfcoat.2020.126212
Publikationsstatus	Veröffentlicht - 19 Juli 2020

Zugriff auf Dokument

10.1016/j.surfcoat.2020.126212

T. Glechner, S. Lang, R. Hahn, M. Alfreider, V. Moraes, D. Primetzhofer, J. Ramme, S. Kolozsvári, D. Kiener, H. Riedl 2020 (SCT 399, 126212)Endgültige, publizierte Fassung, 5,16 MBLizenz: CC BY

Andere Dateien und Links

T. Glechner, S. Lang, R. Hahn, M. Alfreider, V. Moraes, D. Primetzhofer, J. Ramme, S. Kolozsvári, D. Kiener, H. Riedl 2020 (SCT 399, 126212)

Link to publication in Scopus

Dieses zitieren

Glechner, T., Lang, S., Hahn, R., Alfreider, M., Moraes, V., Primetzhofer, D., Ramm, J., Kolozsvári, S., Kiener, D., & Riedl, H. (2020). Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films. Surface and Coatings Technology, 399.2020(15 October), Artikel 126212. https://doi.org/10.1016/j.surfcoat.2020.126212

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title = "Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films",

keywords = "Fracture resistance, Hf-C-N, Non-metal alloying, Thermal stability, Valence electron concentration",

author = "Thomas Glechner and S. Lang and R. Hahn and Markus Alfreider and Vincent Moraes and Daniel Primetzhofer and J{\"u}rgen Ramm and S. Kolozsv{\'a}ri and Daniel Kiener and Helmut Riedl",

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T1 - Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films

AU - Glechner, Thomas

AU - Lang, S.

AU - Hahn, R.

AU - Alfreider, Markus

AU - Moraes, Vincent

AU - Primetzhofer, Daniel

AU - Ramm, Jürgen

AU - Kolozsvári, S.

AU - Kiener, Daniel

AU - Riedl, Helmut

PY - 2020/7/19

Y1 - 2020/7/19

KW - Fracture resistance

KW - Hf-C-N

KW - Non-metal alloying

KW - Thermal stability

KW - Valence electron concentration

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DO - 10.1016/j.surfcoat.2020.126212

M3 - Article

AN - SCOPUS:85088379248

SN - 0257-8972

VL - 399.2020

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

IS - 15 October

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ER -