Defect induced shortening of excess carrier lifetime in single period nipi structures

Titel in Übersetzung: Defect induced shortening of excess carrier lifetime in single period nipi structures

Gerhard Span, Josef Oswald, Gernot Heigl

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

Titel in Übersetzung	Defect induced shortening of excess carrier lifetime in single period nipi structures
Originalsprache	Englisch
Seiten (von - bis)	1307-1313
Fachzeitschrift	Materials science and technology
Jahrgang	14
Publikationsstatus	Veröffentlicht - 1998

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@article{d7c217fc790d4690ba03e9bfa1c50b57,

title = "Defect induced shortening of excess carrier lifetime in single period nipi structures",

author = "Gerhard Span and Josef Oswald and Gernot Heigl",

year = "1998",

language = "English",

volume = "14",

pages = "1307--1313",

journal = "Materials science and technology",

issn = "0267-0836",

publisher = "SAGE Publications Inc.",

}