@conference{f0440aa017df4616862a019cbd6a5be6,
title = "Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy",
author = "Quan Shen and Gregor Hlawacek and Markus Kratzer and Heinz-Georg Flesch and Thomas Potocar and Roland Resel and Adolf Winkler and Christian Teichert",
year = "2010",
language = "English",
note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",
}