Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

Igor Beinik; Markus Kratzer; Astrid Wachauer; Lin Wang; Rainer Lechner; Christian Teichert; Christian Motz; W. Anwand; Gerhard Brauer; Xinyi Chen; Y. F. Hsu; A. Djuricis

doi:10.1063/1.3623764

Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

Titel in Übersetzung: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

Igor Beinik, Markus Kratzer, Astrid Wachauer, Lin Wang, Rainer Lechner, Christian Teichert, Christian Motz, W. Anwand, Gerhard Brauer, Xinyi Chen, Y. F. Hsu, A. Djuricis

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

40 Zitate (Scopus)

Titel in Übersetzung	Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Originalsprache	Englisch
Seiten (von - bis)	052005-1-052005-7
Fachzeitschrift	Journal of applied physics
Jahrgang	110
DOIs	https://doi.org/10.1063/1.3623764
Publikationsstatus	Veröffentlicht - 2011

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10.1063/1.3623764

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@article{6041ff0a9e214644ba9bdd0ae6106c4d,

title = "Electrical properties of ZnO nanorods studied by conductive atomic force microscopy",

author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Xinyi Chen and Hsu, {Y. F.} and A. Djuricis",

year = "2011",

doi = "10.1063/1.3623764",

language = "English",

volume = "110",

pages = "052005--1--052005--7",

journal = "Journal of applied physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Wachauer, Astrid

AU - Wang, Lin

AU - Lechner, Rainer

AU - Teichert, Christian

AU - Motz, Christian

AU - Anwand, W.

AU - Brauer, Gerhard

AU - Chen, Xinyi

AU - Hsu, Y. F.

AU - Djuricis, A.

PY - 2011

Y1 - 2011

U2 - 10.1063/1.3623764

DO - 10.1063/1.3623764

M3 - Article

SN - 0021-8979

VL - 110

SP - 052005-1-052005-7

JO - Journal of applied physics

JF - Journal of applied physics

ER -