Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Igor Beinik; Markus Kratzer; Astrid Wachauer; Lin Wang; Rainer Lechner; Christian Teichert; Christian Motz; W. Anwand; Gerhard Brauer; Xin Yi Chen; Yuk Fan Hsu; Aleksandra B. Djurišić

doi:10.1063/1.4758293

Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Igor Beinik, Markus Kratzer, Astrid Wachauer, Lin Wang, Rainer Lechner, Christian Teichert, Christian Motz, W. Anwand, Gerhard Brauer, Xin Yi Chen, Yuk Fan Hsu, Aleksandra B. Djurišić

Publikation: Beitrag in Fachzeitschrift › Entscheidungsbesprechung › Begutachtung

Originalsprache	Englisch
Aufsatznummer	079903
Seitenumfang	1
Fachzeitschrift	Journal of applied physics
Jahrgang	112.2012
Ausgabenummer	7
DOIs	https://doi.org/10.1063/1.4758293
Publikationsstatus	Veröffentlicht - 1 Okt. 2012

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10.1063/1.4758293

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Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F., & Djurišić, A. B. (2012). Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). Journal of applied physics, 112.2012(7), Artikel 079903. https://doi.org/10.1063/1.4758293

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author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Chen, {Xin Yi} and Hsu, {Yuk Fan} and Djuri{\v s}i{\'c}, {Aleksandra B.}",

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Beinik, I, Kratzer, M, Wachauer, A, Wang, L, Lechner, R , Teichert, C, Motz, C, Anwand, W, Brauer, G, Chen, XY, Hsu, YF & Djurišić, AB 2012, 'Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))', Journal of applied physics, Jg. 112.2012, Nr. 7, 079903. https://doi.org/10.1063/1.4758293

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T2 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Wachauer, Astrid

AU - Wang, Lin

AU - Lechner, Rainer

AU - Teichert, Christian

AU - Motz, Christian

AU - Anwand, W.

AU - Brauer, Gerhard

AU - Chen, Xin Yi

AU - Hsu, Yuk Fan

AU - Djurišić, Aleksandra B.

PY - 2012/10/1

Y1 - 2012/10/1

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U2 - 10.1063/1.4758293

DO - 10.1063/1.4758293

M3 - Comment/debate

AN - SCOPUS:84867523502

SN - 0021-8979

VL - 112.2012

JO - Journal of applied physics

JF - Journal of applied physics

IS - 7

M1 - 079903

ER -