Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Igor Beinik; Markus Kratzer; Astrid Wachauer; Lin Wang; Rainer Lechner; Christian Teichert; Christian Motz; W. Anwand; Gerhard Brauer; Xin Yi Chen; Yuk Fan Hsu; Aleksandra B. Djurišić

doi:10.1063/1.4758293

Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Igor Beinik
, Markus Kratzer
, Astrid Wachauer
, Lin Wang
, Rainer Lechner
, Christian Teichert
, Christian Motz
, W. Anwand
, Gerhard Brauer
, Xin Yi Chen
, Yuk Fan Hsu
, Aleksandra B. Djurišić

Erich-Schmid-Institut für Materialwissenschaft der Österreichischen Akademie der Wissenschaften
Helmholtz Zentrum Dresden-Rossendorf
Hong Kong University of Science and Technology
University of Hong Kong

Publikation: Beitrag in Fachzeitschrift › Entscheidungsbesprechung › Begutachtung

Originalsprache	Englisch
Aufsatznummer	079903
Seitenumfang	1
Fachzeitschrift	Journal of applied physics
Jahrgang	112.2012
Ausgabenummer	7
DOIs	https://doi.org/10.1063/1.4758293
Publikationsstatus	Veröffentlicht - 1 Okt. 2012

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10.1063/1.4758293

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Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F., & Djurišić, A. B. (2012). Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). Journal of applied physics, 112.2012(7), Artikel 079903. https://doi.org/10.1063/1.4758293

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title = "Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))",

author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Chen, \{Xin Yi\} and Hsu, \{Yuk Fan\} and Djuri{\v s}i{\'c}, \{Aleksandra B.\}",

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doi = "10.1063/1.4758293",

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Beinik, I, Kratzer, M, Wachauer, A, Wang, L, Lechner, R, Teichert, C, Motz, C, Anwand, W, Brauer, G, Chen, XY, Hsu, YF & Djurišić, AB 2012, 'Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))', Journal of applied physics, Jg. 112.2012, Nr. 7, 079903. https://doi.org/10.1063/1.4758293

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T2 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Wachauer, Astrid

AU - Wang, Lin

AU - Lechner, Rainer

AU - Teichert, Christian

AU - Motz, Christian

AU - Anwand, W.

AU - Brauer, Gerhard

AU - Chen, Xin Yi

AU - Hsu, Yuk Fan

AU - Djurišić, Aleksandra B.

PY - 2012/10/1

Y1 - 2012/10/1

UR - https://www.scopus.com/pages/publications/84867523502

U2 - 10.1063/1.4758293

DO - 10.1063/1.4758293

M3 - Comment/debate

AN - SCOPUS:84867523502

SN - 0021-8979

VL - 112.2012

JO - Journal of applied physics

JF - Journal of applied physics

IS - 7

M1 - 079903

ER -