Force based Tool Wear Detection using Shannon Entropy and Phase Plane

Werner Kollment; Paul O'Leary; Roland Ritt; Thomas Kluensner

doi:10.1109/I2MTC.2017.7969765

Force based Tool Wear Detection using Shannon Entropy and Phase Plane

Werner Kollment, Paul O'Leary, Roland Ritt, Thomas Kluensner

Lehrstuhl für Automation (530)

Materials Center Leoben Forschungs GmbH

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband

3 Zitate (Scopus)

Originalsprache	Englisch
Titel	I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers
ISBN (elektronisch)	9781509035960
DOIs	https://doi.org/10.1109/I2MTC.2017.7969765
Publikationsstatus	Veröffentlicht - 5 Juli 2017
Veranstaltung	2017 IEEE International Instrumentation and Measurement Technology Conference - Politecnico di Turino, Torino, Italien Dauer: 22 Mai 2017 → 25 Mai 2017 http://2017.imtc.ieee-ims.org/

Konferenz

Konferenz	2017 IEEE International Instrumentation and Measurement Technology Conference
Kurztitel	I2MTC
Land/Gebiet	Italien
Ort	Torino
Zeitraum	22/05/17 → 25/05/17
Internetadresse	http://2017.imtc.ieee-ims.org/

Zugriff auf Dokument

10.1109/I2MTC.2017.7969765

Andere Dateien und Links

Link to publication in Scopus

I²MTC
Roland Schmidt (Redner/-in), Werner Kollment (Redner/-in) & Paul O'Leary (Teilnehmer/-in)
22 Mai 2017 → 25 Mai 2017
Aktivität: Teilnahme an oder Organisation einer Veranstaltung › Konferenzteilnahme

Dieses zitieren

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title = "Force based Tool Wear Detection using Shannon Entropy and Phase Plane",

author = "Werner Kollment and Paul O'Leary and Roland Ritt and Thomas Kluensner",

year = "2017",

month = jul,

day = "5",

doi = "10.1109/I2MTC.2017.7969765",

language = "English",

booktitle = "I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 ; Conference date: 22-05-2017 Through 25-05-2017",

url = "http://2017.imtc.ieee-ims.org/",

}

Kollment, W, O'Leary, P, Ritt, R & Kluensner, T 2017, Force based Tool Wear Detection using Shannon Entropy and Phase Plane. in I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings., 7969765, Institute of Electrical and Electronics Engineers, 2017 IEEE International Instrumentation and Measurement Technology Conference, Torino, Italien, 22/05/17. https://doi.org/10.1109/I2MTC.2017.7969765

Force based Tool Wear Detection using Shannon Entropy and Phase Plane. / Kollment, Werner; O'Leary, Paul; Ritt, Roland et al.
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers, 2017. 7969765.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband

TY - GEN

T1 - Force based Tool Wear Detection using Shannon Entropy and Phase Plane

AU - Kollment, Werner

AU - O'Leary, Paul

AU - Ritt, Roland

AU - Kluensner, Thomas

PY - 2017/7/5

Y1 - 2017/7/5

UR - http://www.scopus.com/inward/record.url?scp=85026756768&partnerID=8YFLogxK

U2 - 10.1109/I2MTC.2017.7969765

DO - 10.1109/I2MTC.2017.7969765

M3 - Conference contribution

AN - SCOPUS:85026756768

BT - I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings

PB - Institute of Electrical and Electronics Engineers

T2 - 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017

Y2 - 22 May 2017 through 25 May 2017

ER -

Force based Tool Wear Detection using Shannon Entropy and Phase Plane

Konferenz

Zugriff auf Dokument

Andere Dateien und Links

Aktivitäten

I²MTC

Dieses zitieren