High resolution determination of local residual stress gradients in single- and multilayer thin film systems

Ruth Treml; Darian Kozic; Johannes Zechner; Xavier Maeder; Hans-Peter Gänser; Ronald Schöngrundner; Johann Michler; Roland Brunner; Daniel Kiener

doi:10.1016/j.actamat.2015.10.044

High resolution determination of local residual stress gradients in single- and multilayer thin film systems

Ruth Treml
, Darian Kozic
, Johannes Zechner
, Xavier Maeder
, Hans-Peter Gänser
, Ronald Schöngrundner
, Johann Michler
, Roland Brunner
, Daniel Kiener

Lehrstuhl für Materialphysik (430)

Materials Center Leoben Forschungs GmbH
Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

43 Zitate (Scopus)

Originalsprache	Englisch
Seiten (von - bis)	616-623
Fachzeitschrift	Acta materialia
Jahrgang	103
DOIs	https://doi.org/10.1016/j.actamat.2015.10.044
Publikationsstatus	Veröffentlicht - 2016

Zugriff auf Dokument

10.1016/j.actamat.2015.10.044

Dieses zitieren

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T1 - High resolution determination of local residual stress gradients in single- and multilayer thin film systems

AU - Treml, Ruth

AU - Kozic, Darian

AU - Zechner, Johannes

AU - Maeder, Xavier

AU - Gänser, Hans-Peter

AU - Schöngrundner, Ronald

AU - Michler, Johann

AU - Brunner, Roland

AU - Kiener, Daniel

PY - 2016

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U2 - 10.1016/j.actamat.2015.10.044

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VL - 103

SP - 616

EP - 623

JO - Acta materialia

JF - Acta materialia

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