How Residual Stresses Affect the Fracture Properties of Layered Thin Films

Daniel Kiener; Ruth Treml; Darian Kozic; Jakub Zalesak; Johannes Zechner; Jozef Keckes; R. Schöngrundner; Hans-Peter Gänser; Roland Brunner

How Residual Stresses Affect the Fracture Properties of Layered Thin Films

Daniel Kiener
, Ruth Treml
, Darian Kozic
, Jakub Zalesak
, Johannes Zechner
, Jozef Keckes
, R. Schöngrundner
, Hans-Peter Gänser
, Roland Brunner

Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun
Materials Center Leoben Forschungs GmbH

Publikation: Konferenzbeitrag › Vortrag › Forschung › Begutachtung

Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2015
Veranstaltung	Nanomechanical Testing in Materials Research and Development IV - Albufeira, Portugal Dauer: 4 Okt. 2015 → 9 Okt. 2015

Konferenz

Konferenz	Nanomechanical Testing in Materials Research and Development IV
Land/Gebiet	Portugal
Ort	Albufeira
Zeitraum	4/10/15 → 9/10/15

Dieses zitieren

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title = "How Residual Stresses Affect the Fracture Properties of Layered Thin Films",

author = "Daniel Kiener and Ruth Treml and Darian Kozic and Jakub Zalesak and Johannes Zechner and Jozef Keckes and R. Sch{\"o}ngrundner and Hans-Peter G{\"a}nser and Roland Brunner",

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language = "English",

note = "Nanomechanical Testing in Materials Research and Development IV ; Conference date: 04-10-2015 Through 09-10-2015",

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TY - CONF

T1 - How Residual Stresses Affect the Fracture Properties of Layered Thin Films

AU - Kiener, Daniel

AU - Treml, Ruth

AU - Kozic, Darian

AU - Zalesak, Jakub

AU - Zechner, Johannes

AU - Keckes, Jozef

AU - Schöngrundner, R.

AU - Gänser, Hans-Peter

AU - Brunner, Roland

PY - 2015

Y1 - 2015

M3 - Presentation

T2 - Nanomechanical Testing in Materials Research and Development IV

Y2 - 4 October 2015 through 9 October 2015

ER -