In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

Publikation: Buch/Bericht › Sammelband › Forschung

Abstract

Konferenzort: Leoben
Konferenzdatum: 02.10.09

TY - BOOK

T1 - In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

A2 - Teichert, Christian

PY - 2009

Y1 - 2009

N2 - Konferenzort: Leoben Konferenzdatum: 02.10.09

AB - Konferenzort: Leoben Konferenzdatum: 02.10.09

M3 - Anthology

BT - In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

PB - Eigenverlag

ER -