In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings

Titel in Übersetzung: In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

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Titel in Übersetzung	In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
Originalsprache	Englisch
Seiten (von - bis)	705-711
Fachzeitschrift	Advanced engineering materials
Publikationsstatus	Veröffentlicht - 2011

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@article{0de865f9ba47427093651136baad4343,

title = "In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings",

author = "M. Bartosik and R. Pitonak and Jozef Keckes",

year = "2011",

language = "English",

pages = "705--711",

journal = " Advanced engineering materials",

issn = "1438-1656",

publisher = "Wiley-VCH ",

}