In-situ TEM investigation of toughening in Silicon at small scales

Inas Issa; Christoph Gammer; Stefan Kolitsch; Anton Hohenwarter; Peter J. Imrich; Reinhard Pippan; Daniel Kiener

doi:10.1016/j.mattod.2021.03.009

In-situ TEM investigation of toughening in Silicon at small scales

Inas Issa, Christoph Gammer, Stefan Kolitsch, Anton Hohenwarter, Peter J. Imrich, Reinhard Pippan, Daniel Kiener

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

92 Downloads (Pure)

Originalsprache	Englisch
Seiten (von - bis)	29-37
Seitenumfang	9
Fachzeitschrift	Materials today
Jahrgang	48
Ausgabenummer	48
Frühes Online-Datum	3 Juli 2021
DOIs	https://doi.org/10.1016/j.mattod.2021.03.009
Publikationsstatus	Veröffentlicht - Sept. 2021

Bibliographische Notiz

Funding Information:
I.I. and D.K. acknowledge funding by the European Research Council under Grant number 771146 (TOUGHIT). Authors would like to acknowledge Gabriele Felber and Herwig Felber for preparing wedge shaped samples, and Manuel Pfeifenberger and Alexander Jelinek for micro lamellas cut on the top surface of the wedge-shaped samples by a femtosecond laser. The authors gratefully acknowledge the financial support under the scope of the COMET program within the K2 Center “Integrated Computational Material, Process and Product Engineering, IC-MPPE” (Strategic Project P1.3).

Publisher Copyright:
© 2021 The Author(s)

Zugriff auf Dokument

10.1016/j.mattod.2021.03.009

I. Issa, C. Gammer, S. Kolitsch, A. Hohenwarter, P.J. Imrich, R. Pippan, D. Kiener 2021 (Mater Today, online)Nachweis, 1,86 MBLizenz: CC BY

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

Dieses zitieren

@article{215440bb270a4a8a97c282bf34c45b54,

title = "In-situ TEM investigation of toughening in Silicon at small scales",

keywords = "Brittle Ductile Transition (BDT), Fracture toughness, In-situ TEM, Nanoscale fracture experiments, Single crystal (SC) Silicon (Si), Size scale effect, Toughening",

author = "Inas Issa and Christoph Gammer and Stefan Kolitsch and Anton Hohenwarter and Imrich, {Peter J.} and Reinhard Pippan and Daniel Kiener",

note = "Publisher Copyright: {\textcopyright} 2021 The Author(s)",

year = "2021",

month = sep,

doi = "10.1016/j.mattod.2021.03.009",

language = "English",

volume = "48",

pages = "29--37",

journal = "Materials today",

issn = "1369-7021",

publisher = "Elsevier",

number = "48",

}

TY - JOUR

T1 - In-situ TEM investigation of toughening in Silicon at small scales

AU - Issa, Inas

AU - Gammer, Christoph

AU - Kolitsch, Stefan

AU - Hohenwarter, Anton

AU - Imrich, Peter J.

AU - Pippan, Reinhard

AU - Kiener, Daniel

PY - 2021/9

Y1 - 2021/9

KW - Brittle Ductile Transition (BDT)

KW - Fracture toughness

KW - In-situ TEM

KW - Nanoscale fracture experiments

KW - Single crystal (SC) Silicon (Si)

KW - Size scale effect

KW - Toughening

UR - http://www.scopus.com/inward/record.url?scp=85109089641&partnerID=8YFLogxK

U2 - 10.1016/j.mattod.2021.03.009

DO - 10.1016/j.mattod.2021.03.009

M3 - Article

AN - SCOPUS:85109089641

SN - 1369-7021

VL - 48

SP - 29

EP - 37

JO - Materials today

JF - Materials today

IS - 48

ER -