Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy

Yu.N. Kozyrev; M.Yu. Rubezhanska; V. K. Sklyar; M. T. Kartel; N. V. Dmitruk; Christian Teichert; Christian Hofer

Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy

Titel in Übersetzung: Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy

Yu.N. Kozyrev
, M.Yu. Rubezhanska
, V. K. Sklyar
, M. T. Kartel
, N. V. Dmitruk
, Christian Teichert
, Christian Hofer

Lehrstuhl für Physik (460)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

Titel in Übersetzung	Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy
Originalsprache	Englisch
Seiten (von - bis)	71-76
Fachzeitschrift	Dopovidi Nacional'noï Akademiï Nauk Ukraïny
Publikationsstatus	Veröffentlicht - 2010

Zugriff auf Dokument

http://dspace.nbuv.gov.ua/handle/123456789/19255

Dieses zitieren

@article{dd8545eb87c840e4ba8cc10069d7ac15,

title = "Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy",

author = "Yu.N. Kozyrev and M.Yu. Rubezhanska and Sklyar, \{V. K.\} and Kartel, \{M. T.\} and Dmitruk, \{N. V.\} and Christian Teichert and Christian Hofer",

year = "2010",

language = "English",

pages = "71--76",

journal = "Dopovidi Nacional'no{\"i} Akademi{\"i} Nauk Ukra{\"i}ny ",

issn = "1025-6415",

}

TY - JOUR

T1 - Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy

AU - Kozyrev, Yu.N.

AU - Rubezhanska, M.Yu.

AU - Sklyar, V. K.

AU - Kartel, M. T.

AU - Dmitruk, N. V.

AU - Teichert, Christian

AU - Hofer, Christian

PY - 2010

Y1 - 2010

M3 - Article

SN - 1025-6415

SP - 71

EP - 76

JO - Dopovidi Nacional'noï Akademiï Nauk Ukraïny

JF - Dopovidi Nacional'noï Akademiï Nauk Ukraïny

ER -