Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators

Titel in Übersetzung: Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

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Titel in Übersetzung	Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2013
Veranstaltung	Annual Meeting of German Physical Society (DPG) - Regensburg, Deutschland Dauer: 12 März 2013 → 14 März 2013

Konferenz	Annual Meeting of German Physical Society (DPG)
Land/Gebiet	Deutschland
Ort	Regensburg
Zeitraum	12/03/13 → 14/03/13

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@conference{64ca3820bfeb4e908c29dae26c5b583c,

title = "Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators",

author = "Monika Mirkowska and Markus Kratzer and Christian Teichert and Helmut Flachberger",

year = "2013",

language = "English",

note = "Annual Meeting of German Physical Society (DPG) ; Conference date: 12-03-2013 Through 14-03-2013",

}