LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2

Titel in Übersetzung: LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

3 Zitate (Scopus)

Titel in Übersetzung	LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2
Originalsprache	Englisch
Seiten (von - bis)	1163-1166
Fachzeitschrift	Journal of electron spectroscopy and related phenomena
Jahrgang	144-147
Publikationsstatus	Veröffentlicht - 2005

Dieses zitieren

@article{438df87cd4634d6b8d58474fc3b89c79,

title = "LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2",

author = "Christian Teichert and Sascha Kremmer",

year = "2005",

language = "English",

volume = "144-147",

pages = "1163--1166",

journal = "Journal of electron spectroscopy and related phenomena",

issn = "0368-2048",

publisher = "Elsevier B.V.",

}