Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Sergey V. Kondratenko; V. S. Lysenko; Yury N. Kozyrev; Markus Kratzer; D. P. Storozhuk; S. A. Iliash; Caterina Marina Czibula; Christian Teichert

doi:10.1016/j.apsusc.2016.07.148

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Sergey V. Kondratenko, V. S. Lysenko, Yury N. Kozyrev, Markus Kratzer, D. P. Storozhuk, S. A. Iliash, Caterina Marina Czibula, Christian Teichert

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

8 Zitate (Scopus)

Originalsprache	Englisch
Seiten (von - bis)	783-789
Seitenumfang	7
Fachzeitschrift	Applied surface science
Jahrgang	389.2016
Ausgabenummer	15 December
DOIs	https://doi.org/10.1016/j.apsusc.2016.07.148
Publikationsstatus	Veröffentlicht - 15 Dez. 2016

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10.1016/j.apsusc.2016.07.148

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@article{d08ed61018be44fb88820c863643d149,

title = "Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy",

keywords = "Carrier lifetime, Heterostructures, Quantum dots, Recombination processes",

author = "Kondratenko, {Sergey V.} and Lysenko, {V. S.} and Kozyrev, {Yury N.} and Markus Kratzer and Storozhuk, {D. P.} and Iliash, {S. A.} and Czibula, {Caterina Marina} and Christian Teichert",

year = "2016",

month = dec,

day = "15",

doi = "10.1016/j.apsusc.2016.07.148",

language = "English",

volume = "389.2016",

pages = "783--789",

journal = "Applied surface science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "15 December",

}

TY - JOUR

T1 - Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

AU - Kondratenko, Sergey V.

AU - Lysenko, V. S.

AU - Kozyrev, Yury N.

AU - Kratzer, Markus

AU - Storozhuk, D. P.

AU - Iliash, S. A.

AU - Czibula, Caterina Marina

AU - Teichert, Christian

PY - 2016/12/15

Y1 - 2016/12/15

KW - Carrier lifetime

KW - Heterostructures

KW - Quantum dots

KW - Recombination processes

UR - http://www.scopus.com/inward/record.url?scp=84982840776&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2016.07.148

DO - 10.1016/j.apsusc.2016.07.148

M3 - Article

AN - SCOPUS:84982840776

SN - 0169-4332

VL - 389.2016

SP - 783

EP - 789

JO - Applied surface science

JF - Applied surface science

IS - 15 December

ER -