Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning

Long-term degradation of La_0.6Sr_0.4Co_0.2Fe_0.8O_3-δ IT-SOFC cathodes due to silicon poisoning

Martin Perz, Edith Bucher, Christian Gspan, Jörg Waldhäusl, Ferdinand Hofer, Werner Sitte

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

16 Zitate (Scopus)

@article{cc16478138664f01a24c9f093a68970d,

title = "Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning",

author = "Martin Perz and Edith Bucher and Christian Gspan and J{\"o}rg Waldh{\"a}usl and Ferdinand Hofer and Werner Sitte",

year = "2016",

language = "English",

volume = "288",

pages = "22--27",

journal = "Solid State Ionics",

issn = "0167-2738",

publisher = "Elsevier",

}