Magnetic depth profiles from resonant soft x-ray scattering: Application to Dy thin films

Holger Ott; C. Schüßler-Langeheine; E. Schierle; G. Kaindl; E. Weschke

doi:10.1063/1.2206699

Magnetic depth profiles from resonant soft x-ray scattering: Application to Dy thin films

Holger Ott
, C. Schüßler-Langeheine
, E. Schierle
, G. Kaindl
, E. Weschke

Freie Universität Berlin

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

Abstract

We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.

Originalsprache	Englisch
Aufsatznummer	212507
Fachzeitschrift	Applied physics letters
Jahrgang	2006
Ausgabenummer	Volume 88, Issue 21
DOIs	https://doi.org/10.1063/1.2206699
Publikationsstatus	Veröffentlicht - 21 Mai 2006
Extern publiziert	Ja

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