Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

N. Vaxelaire; H. Proudhon; S. Labat; Christoph Kirchlechner; Jozef Keckes; V. Jaques; S. Ravy; S. Forest; O. Thomas

Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Titel in Übersetzung: Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

N. Vaxelaire, H. Proudhon, S. Labat, Christoph Kirchlechner, Jozef Keckes, V. Jaques, S. Ravy, S. Forest, O. Thomas

Lehrstuhl für Materialphysik (430)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

21 Zitate (Scopus)

Titel in Übersetzung	Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Originalsprache	Englisch
Seiten (von - bis)	1-12
Fachzeitschrift	New journal of physics
Publikationsstatus	Veröffentlicht - 2010

Dieses zitieren

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title = "Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction",

author = "N. Vaxelaire and H. Proudhon and S. Labat and Christoph Kirchlechner and Jozef Keckes and V. Jaques and S. Ravy and S. Forest and O. Thomas",

year = "2010",

language = "English",

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journal = "New journal of physics",

issn = "1367-2630",

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TY - JOUR

T1 - Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

AU - Vaxelaire, N.

AU - Proudhon, H.

AU - Labat, S.

AU - Kirchlechner, Christoph

AU - Keckes, Jozef

AU - Jaques, V.

AU - Ravy, S.

AU - Forest, S.

AU - Thomas, O.

PY - 2010

Y1 - 2010

M3 - Article

SN - 1367-2630

SP - 1

EP - 12

JO - New journal of physics

JF - New journal of physics

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