Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

M. Bartosik; Rostislav Daniel; Christian Mitterer; S. Schoeder; M. Burghammer; Jozef Keckes

Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

Titel in Übersetzung: Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

M. Bartosik, Rostislav Daniel, Christian Mitterer, S. Schoeder, M. Burghammer, Jozef Keckes

Lehrstuhl für Materialphysik (430)

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	Size and Strain VI - Diffraction Analysis of the Microstructure of Materials - Hyères, Frankreich Dauer: 16 Okt. 2011 → …

Konferenz

Konferenz	Size and Strain VI - Diffraction Analysis of the Microstructure of Materials
Land/Gebiet	Frankreich
Ort	Hyères
Zeitraum	16/10/11 → …

Dieses zitieren

@conference{6e381709e0e94880beef4fb379231cc3,

title = "Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings",

author = "M. Bartosik and Rostislav Daniel and Christian Mitterer and S. Schoeder and M. Burghammer and Jozef Keckes",

year = "2011",

language = "English",

note = "Size and Strain VI - Diffraction Analysis of the Microstructure of Materials ; Conference date: 16-10-2011",

}

Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. / Bartosik, M.; Daniel, Rostislav ; Mitterer, Christian et al.
2011. Postersitzung präsentiert bei Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, Frankreich.

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

TY - CONF

T1 - Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

AU - Bartosik, M.

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Schoeder, S.

AU - Burghammer, M.

AU - Keckes, Jozef

PY - 2011

Y1 - 2011

M3 - Poster

T2 - Size and Strain VI - Diffraction Analysis of the Microstructure of Materials

Y2 - 16 October 2011

ER -