Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

Titel in Übersetzung: Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	Applications of X-ray Analysis - Denver, USA / Vereinigte Staaten Dauer: 2 Okt. 2010 → 6 Okt. 2010

Konferenz	Applications of X-ray Analysis
Land/Gebiet	USA / Vereinigte Staaten
Ort	Denver
Zeitraum	2/10/10 → 6/10/10

Dieses zitieren

@conference{20e6cdbab8944808bd369691aae7dd5a,

title = "Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films",

author = "Jozef Keckes and Matthias Bartosik and Rostislav Daniel and Christian Mitterer and G. Maier and S Schoeder and M. Burghammer",

year = "2010",

language = "English",

note = "Applications of X-ray Analysis ; Conference date: 02-10-2010 Through 06-10-2010",

}

TY - CONF

T1 - Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

AU - Keckes, Jozef

AU - Bartosik, Matthias

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Maier, G.

AU - Schoeder, S

AU - Burghammer, M.

PY - 2010

Y1 - 2010

M3 - Poster

T2 - Applications of X-ray Analysis

Y2 - 2 October 2010 through 6 October 2010

ER -