Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

Titel in Übersetzung: Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

Igor Beinik, B. Galiana, Markus Kratzer, Christian Teichert, I. Rey-Stolle, C. Algora, Paloma Tejedor

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

5 Zitate (Scopus)

Titel in Übersetzung	Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Originalsprache	Englisch
Seiten (von - bis)	C5G5-C5G10
Fachzeitschrift	Journal of vacuum science & technology / B (JVST)
Jahrgang	28
DOIs	https://doi.org/10.1116/1.3454373
Publikationsstatus	Veröffentlicht - 2010

Zugriff auf Dokument

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author = "Igor Beinik and B. Galiana and Markus Kratzer and Christian Teichert and I. Rey-Stolle and C. Algora and Paloma Tejedor",

year = "2010",

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T1 - Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

AU - Beinik, Igor

AU - Galiana, B.

AU - Kratzer, Markus

AU - Teichert, Christian

AU - Rey-Stolle, I.

AU - Algora, C.

AU - Tejedor, Paloma

PY - 2010

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DO - 10.1116/1.3454373

M3 - Article

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SP - C5G5-C5G10

JO - Journal of vacuum science & technology / B (JVST)

JF - Journal of vacuum science & technology / B (JVST)

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