Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

G. Brauer; W. Anwand; D. Grambole; W. Skorupa; Yue Hou; Andrei Andreev; Christian Teichert; K. H. Tam; A. B. Djurisic

doi:10.1088/0957-4484/18/19/195301

Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

Titel in Übersetzung: Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

G. Brauer
, W. Anwand
, D. Grambole
, W. Skorupa
, Yue Hou
, Andrei Andreev
, Christian Teichert
, K. H. Tam
, A. B. Djurisic

Lehrstuhl für Physik (460)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

25 Zitate (Scopus)

Titel in Übersetzung	Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Originalsprache	Englisch
Seiten (von - bis)	195301-1-195301-8
Fachzeitschrift	Nanotechnology
Jahrgang	18
DOIs	https://doi.org/10.1088/0957-4484/18/19/195301
Publikationsstatus	Veröffentlicht - 2007

Zugriff auf Dokument

10.1088/0957-4484/18/19/195301

Dieses zitieren

Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H., & Djurisic, A. B. (2007). Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis. Nanotechnology, 18, 195301-1-195301-8. https://doi.org/10.1088/0957-4484/18/19/195301

@article{e2de485410a3409886b25a83042c551e,

title = "Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis",

author = "G. Brauer and W. Anwand and D. Grambole and W. Skorupa and Yue Hou and Andrei Andreev and Christian Teichert and Tam, \{K. H.\} and Djurisic, \{A. B.\}",

year = "2007",

doi = "10.1088/0957-4484/18/19/195301",

language = "English",

volume = "18",

pages = "195301--1--195301--8",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing Ltd.",

}

TY - JOUR

T1 - Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

AU - Brauer, G.

AU - Anwand, W.

AU - Grambole, D.

AU - Skorupa, W.

AU - Hou, Yue

AU - Andreev, Andrei

AU - Teichert, Christian

AU - Tam, K. H.

AU - Djurisic, A. B.

PY - 2007

Y1 - 2007

U2 - 10.1088/0957-4484/18/19/195301

DO - 10.1088/0957-4484/18/19/195301

M3 - Article

SN - 0957-4484

VL - 18

SP - 195301-1-195301-8

JO - Nanotechnology

JF - Nanotechnology

ER -