Oxidation resistance of cathodic arc evaporated Cr0.74Ta0.26N coatings

Christina Kainz, Christian Saringer, Michael Burtscher, Michael Tkadletz, Andreas Stark, Norbert Schell, Markus Pohler, Christoph Czettl, Daniel Kiener, Nina Schalk

Publikation: Beitrag in FachzeitschriftArtikelForschungBegutachtung


Owing to their combination of high hardness and increased fracture toughness, CrTaN coatings have recently gained increasing interest as suitable candidates for metal cutting applications. However, up to now, the detailed mechanisms underlying the oxidation of this promising coating system are not thoroughly understood. Thus within this work, the evolution of microstructure and phase composition of a cathodic arc evaporated Cr 0.74Ta 0.26N coating were illuminated in ambient atmosphere up to 1400 °C. In situ high-energy X-ray diffraction showed that powdered face-centered cubic (fcc) CrTaN displays an excellent oxidation resistance up to ∼1050 °C, where the formation of tetragonal (t) CrTaO 4 and rhombohedral (r) Cr 2O 3 sets in. The compact CrTaN deposited on sapphire subjected to 1225 °C in ambient atmosphere exhibits intact fcc-CrTaN regions near the substrate, a porous intermediate layer of r-Cr 2O 3 and t-CrTaO 4 and a dense r-Cr 2O 3 oxide scale at the surface.

FachzeitschriftScripta materialia
Ausgabenummer1 April
Frühes Online-Datum7 Jan. 2022
PublikationsstatusVeröffentlicht - 1 Apr. 2022

Bibliographische Notiz

Funding Information:
The financial support by the Austrian Federal Ministry for Digital and Economic Affairs and the National Foundation for Research, Technology and Development is gratefully acknowledged. The authors furthermore acknowledge funding by the European Research Council (Grant number: 771146). We thank Dr. Jarosław Wosik (Materials Center Leoben) and Dr. Julian Wagner (Materials Center Leoben) for SEM/FIB/EDX work. The authors acknowledge DESY (Hamburg, Germany), a member of the Helmholtz Association HGF, for the provision of experimental facilities.

Publisher Copyright:
© 2021 The Author(s)

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