Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy

Quan Shen; Andreas Pavitschitz; Gregor Hlawacek; Christian Teichert; Matthias Edler; Simone Radl; Thomas Grießer; Alexandra Lex; Thomas Höfler; Georg Trimmel; Wolfgang Kern

Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy

Titel in Übersetzung: Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy

Quan Shen
, Andreas Pavitschitz
, Gregor Hlawacek
, Christian Teichert
, Matthias Edler
, Simone Radl
, Thomas Grießer
, Alexandra Lex
, Thomas Höfler
, Georg Trimmel
, Wolfgang Kern

Lehrstuhl für Chemie der Kunststoffe (231)

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	MRS Spring Meeting 2011 - San Francisco, USA / Vereinigte Staaten Dauer: 25 Apr. 2011 → 29 Apr. 2011

Konferenz

Konferenz	MRS Spring Meeting 2011
Land/Gebiet	USA / Vereinigte Staaten
Ort	San Francisco
Zeitraum	25/04/11 → 29/04/11

Dieses zitieren

Shen, Q., Pavitschitz, A., Hlawacek, G., Teichert, C., Edler, M., Radl, S., Grießer, T., Lex, A., Höfler, T., Trimmel, G., & Kern, W. (2011). Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy. Postersitzung präsentiert bei MRS Spring Meeting 2011, San Francisco, Kalifornien, USA / Vereinigte Staaten.

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title = "Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy",

author = "Quan Shen and Andreas Pavitschitz and Gregor Hlawacek and Christian Teichert and Matthias Edler and Simone Radl and Thomas Grie{\ss}er and Alexandra Lex and Thomas H{\"o}fler and Georg Trimmel and Wolfgang Kern",

year = "2011",

language = "English",

note = "MRS Spring Meeting April 25-29 2011 San Francisco ; Conference date: 25-04-2011 Through 29-04-2011",

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TY - CONF

T1 - Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy

AU - Shen, Quan

AU - Pavitschitz, Andreas

AU - Hlawacek, Gregor

AU - Teichert, Christian

AU - Edler, Matthias

AU - Radl, Simone

AU - Grießer, Thomas

AU - Lex, Alexandra

AU - Höfler, Thomas

AU - Trimmel, Georg

AU - Kern, Wolfgang

PY - 2011

Y1 - 2011

M3 - Poster

T2 - MRS Spring Meeting April 25-29 2011 San Francisco

Y2 - 25 April 2011 through 29 April 2011

ER -