PCB drop test lifetime assessment based on simulations and cyclic bend tests

Titel in Übersetzung: PCB drop test lifetime assessment based on simulations and cyclic bend tests

Peter Fuchs, Gerald Pinter, Zoltan Major

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

11 Zitate (Scopus)

Titel in Übersetzung	PCB drop test lifetime assessment based on simulations and cyclic bend tests
Originalsprache	Englisch
Seiten (von - bis)	774-781
Fachzeitschrift	Microelectronics Reliability
Jahrgang	53
Publikationsstatus	Veröffentlicht - 2013

Dieses zitieren

@article{e01fdb19d9c041b5910b84cd4cab2b0d,

title = "PCB drop test lifetime assessment based on simulations and cyclic bend tests",

author = "Peter Fuchs and Gerald Pinter and Zoltan Major",

year = "2013",

language = "English",

volume = "53",

pages = "774--781",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

}