Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Mark Tratnig; Helmut Hlobil; Johann Reisinger; Paul O'Leary

doi:10.1117/12.586501

Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Mark Tratnig
, Helmut Hlobil
, Johann Reisinger
, Paul O'Leary

Lehrstuhl für Automation und Messtechnik (530)

Schienen GmbH

Publikation: Beitrag in Fachzeitschrift › Konferenzartikel › Begutachtung

2 Zitate (Scopus)

Originalsprache	Englisch
Aufsatznummer	10
Seiten (von - bis)	74-85
Seitenumfang	12
Fachzeitschrift	Proceedings of SPIE - The International Society for Optical Engineering
Jahrgang	5679
DOIs	https://doi.org/10.1117/12.586501
Publikationsstatus	Veröffentlicht - 21 Juli 2005
Veranstaltung	Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII - San Jose, CA, USA / Vereinigte Staaten Dauer: 17 Jan. 2005 → 18 Jan. 2005

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10.1117/12.586501

Andere Dateien und Links

Link to publication in Scopus

Dieses zitieren

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title = "Positional and orientational referencing of multiple light sectioning systems for precision profile measurement",

keywords = "Collineation, Light sectioning, Precision strip, Referencing, Strip inspection, Visual inspection",

author = "Mark Tratnig and Helmut Hlobil and Johann Reisinger and Paul O'Leary",

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doi = "10.1117/12.586501",

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AU - Tratnig, Mark

AU - Hlobil, Helmut

AU - Reisinger, Johann

AU - O'Leary, Paul

PY - 2005/7/21

Y1 - 2005/7/21

KW - Collineation

KW - Light sectioning

KW - Precision strip

KW - Referencing

KW - Strip inspection

KW - Visual inspection

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

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T2 - Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII

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