Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

Edith Bucher; Christian Gspan; Ferdinand Hofer; Werner Sitte

Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

Titel in Übersetzung: Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

Edith Bucher, Christian Gspan, Ferdinand Hofer, Werner Sitte

Lehrstuhl für Physikalische Chemie (480)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

35 Zitate (Scopus)

Titel in Übersetzung	Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy
Originalsprache	Englisch
Seiten (von - bis)	7-11
Fachzeitschrift	Solid State Ionics
Jahrgang	230
Publikationsstatus	Veröffentlicht - 2013

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title = "Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy",

author = "Edith Bucher and Christian Gspan and Ferdinand Hofer and Werner Sitte",

year = "2013",

language = "English",

volume = "230",

pages = "7--11",

journal = "Solid State Ionics",

issn = "0167-2738",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

AU - Bucher, Edith

AU - Gspan, Christian

AU - Hofer, Ferdinand

AU - Sitte, Werner

PY - 2013

Y1 - 2013

M3 - Article

SN - 0167-2738

VL - 230

SP - 7

EP - 11

JO - Solid State Ionics

JF - Solid State Ionics

ER -