Scanning electron microscope: An essential equipment of failure analysis

Publikation: Konferenzbeitrag › Poster › Forschung

Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2018
Veranstaltung	Microscopy & Microanalysis - Baltimore, USA / Vereinigte Staaten Dauer: 5 Aug. 2018 → 9 Aug. 2018

Dieses zitieren

@conference{2a9daefc702e448aafba45b2106501f2,

title = "Scanning electron microscope: An essential equipment of failure analysis",

author = "Michael Panzenb{\"o}ck and Caroline Freitag and Gerhard Hawranek and \{Mendez Martin\}, Francisca and Boryana Rashkova",

year = "2018",

language = "English",

note = "Microscopy \& Microanalysis ; Conference date: 05-08-2018 Through 09-08-2018",

}