Selective interface toughness measurements of layered thin films

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

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@article{25548c7240b34eb68b3853546df307cc,

title = "Selective interface toughness measurements of layered thin films",

author = "Ruth Konetschnik and Rostislav Daniel and Roland Brunner and Daniel Kiener",

year = "2017",

month = mar,

day = "9",

doi = "10.1063/1.4978337",

language = "English",

volume = "7.2017",

journal = "AIP Advances",

issn = "2158-3226",

publisher = "American Institute of Physics",

number = "3",

}