Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Titel in Übersetzung: Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2006
Veranstaltung	Gordon Research Conference on thin film & small scale mechanical behavior 2006 - Waterville, USA / Vereinigte Staaten Dauer: 30 Juli 2006 → 4 Aug. 2006

Konferenz	Gordon Research Conference on thin film & small scale mechanical behavior 2006
Land/Gebiet	USA / Vereinigte Staaten
Ort	Waterville
Zeitraum	30/07/06 → 4/08/06

Dieses zitieren

@conference{36fed0b04a184904a822b21f39f8b836,

title = "Size effect in metallic thin films characterized by low-temperature X-ray diffraction",

author = "Ernst Eiper and Martinschitz, \{Klaus J{\"u}rgen\} and Gerhard Dehm and Jozef Keckes",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film \& small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

}

Size effect in metallic thin films characterized by low-temperature X-ray diffraction. / Eiper, Ernst; Martinschitz, Klaus Jürgen; Dehm, Gerhard et al.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung