Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

Titel in Übersetzung: Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

Daniel Kiener, Andrew M. Minor

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

135 Zitate (Scopus)

Titel in Übersetzung	Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy
Originalsprache	Englisch
Seiten (von - bis)	1328-1337
Fachzeitschrift	Acta materialia
Jahrgang	59
DOIs	https://doi.org/10.1016/j.actamat.2010.10.065
Publikationsstatus	Veröffentlicht - 2011

Zugriff auf Dokument

@article{9233e56ff15943ad8861aacb709661aa,

title = "Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy",

author = "Daniel Kiener and Minor, {Andrew M.}",

year = "2011",

doi = "10.1016/j.actamat.2010.10.065",

language = "English",

volume = "59",

pages = "1328--1337",

journal = "Acta materialia",

issn = "1359-6454",

publisher = "Elsevier",

}