Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

S. Cazottes, Z.L. Zhang, R. Daniel, J.S. Chawla, D. Gall, G. Dehm

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

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@article{f74cdb3d8d674a83a948ba723a09810b,

title = "Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM",

author = "S. Cazottes and Z.L. Zhang and R. Daniel and J.S. Chawla and D. Gall and G. Dehm",

year = "2010",

doi = "10.1016/j.tsf.2010.09.017",

language = "English",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

AU - Cazottes, S.

AU - Zhang, Z.L.

AU - Daniel, R.

AU - Chawla, J.S.

AU - Gall, D.

AU - Dehm, G.

PY - 2010

Y1 - 2010

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78649726907&partnerID=MN8TOARS

U2 - 10.1016/j.tsf.2010.09.017

DO - 10.1016/j.tsf.2010.09.017

M3 - Article

SN - 0040-6090

JO - Thin solid films

JF - Thin solid films

ER -