Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

Titel in Übersetzung: Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Temperature dependence of residual stresses in thin films determined by the substrate curvatur method
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2006
Veranstaltung	7th European Conference Residual Stresses ECRS7 - Berlin, Deutschland Dauer: 13 Sept. 2006 → 15 Sept. 2006

Konferenz	7th European Conference Residual Stresses ECRS7
Land/Gebiet	Deutschland
Ort	Berlin
Zeitraum	13/09/06 → 15/09/06

Dieses zitieren

@conference{852f401c963d4c42abb99eaa09ed3497,

title = "Temperature dependence of residual stresses in thin films determined by the substrate curvatur method",

author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Harald K{\"o}stenbauer and Stefan Massl and Jozef Keckes",

year = "2006",

language = "English",

note = "7th European Conference Residual Stresses ECRS7 ; Conference date: 13-09-2006 Through 15-09-2006",

}

TY - CONF

T1 - Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

AU - Eiper, Ernst

AU - Martinschitz, Klaus-Jürgen

AU - Köstenbauer, Harald

AU - Massl, Stefan

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Poster

T2 - 7th European Conference Residual Stresses ECRS7

Y2 - 13 September 2006 through 15 September 2006

ER -