Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction

Titel in Übersetzung: Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

1 Zitat (Scopus)

Titel in Übersetzung	Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
Originalsprache	Englisch
Seiten (von - bis)	765-766
Fachzeitschrift	Acta materialia
Jahrgang	55
Publikationsstatus	Veröffentlicht - 2007

Dieses zitieren

@article{b99dd66e58d646b698df57b5bc1a1dec,

title = "Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction",

author = "Petra Sonnweber-Ribic and P. Gruber and Gerhard Dehm and Eduard Arzt",

year = "2007",

language = "English",

volume = "55",

pages = "765--766",

journal = "Acta materialia",

issn = "1359-6454",

publisher = "Acta Materialia Inc",

}