TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

Titel in Übersetzung: TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

7 Zitate (Scopus)

Titel in Übersetzung	TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings
Originalsprache	Englisch
Seiten (von - bis)	1857-1861
Fachzeitschrift	Analytical and bioanalytical chemistry
DOIs	https://doi.org/10.1007/sO0216-008-2525-7
Publikationsstatus	Veröffentlicht - 2009

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title = "TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings",

author = "J. Schn{\"o}ller and Robert Franz and Christian Mitterer and H. Hutter",

year = "2009",

doi = "10.1007/sO0216-008-2525-7",

language = "English",

pages = "1857--1861",

journal = "Analytical and bioanalytical chemistry",

issn = "1618-2642",

publisher = "Springer Science and Business Media Deutschland GmbH",

}

TY - JOUR

T1 - TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

AU - Schnöller, J.

AU - Franz, Robert

AU - Mitterer, Christian

AU - Hutter, H.

PY - 2009

Y1 - 2009

U2 - 10.1007/sO0216-008-2525-7

DO - 10.1007/sO0216-008-2525-7

M3 - Article

SN - 1618-2642

SP - 1857

EP - 1861

JO - Analytical and bioanalytical chemistry

JF - Analytical and bioanalytical chemistry

ER -