Towards reliable modelling of ELNES of AlxGa1-xN and other AlN based ternary alloys

Titel in Übersetzung: Towards reliable modelling of ELNES of AlxGa1-xN and other AlN based ternary alloys

David Holec, Richard Rachbauer, Daniel Kiener, P.D. Cherns, P.M.F.J. Costa, Paul Heinz Mayrhofer, C.J. Humphreys

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Towards reliable modelling of ELNES of AlxGa1-xN and other AlN based ternary alloys
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	Microscopy of Semiconducting Materials 2011: MSM XVII - Cambridge, Großbritannien / Vereinigtes Königreich Dauer: 4 Apr. 2011 → 7 Apr. 2011

Konferenz	Microscopy of Semiconducting Materials 2011
Land/Gebiet	Großbritannien / Vereinigtes Königreich
Ort	Cambridge
Zeitraum	4/04/11 → 7/04/11

Dieses zitieren

@conference{bed59415f6f042f5ba6ea768c60984b3,

title = "Towards reliable modelling of ELNES of AlxGa1-xN and other AlN based ternary alloys",

author = "David Holec and Richard Rachbauer and Daniel Kiener and P.D. Cherns and P.M.F.J. Costa and Mayrhofer, {Paul Heinz} and C.J. Humphreys",

year = "2011",

language = "English",

note = "MSM XVII ; Conference date: 04-04-2011 Through 07-04-2011",

}