X-ray characterization of semiconductor nanostructures

Titel in Übersetzung: X-ray characterization of semiconductor nanostructures

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

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Titel in Übersetzung	X-ray characterization of semiconductor nanostructures
Originalsprache	Englisch
Seiten (von - bis)	064002/1- 064002/7
Fachzeitschrift	Semiconductor science and technology
Jahrgang	26
DOIs	https://doi.org/10.1088/0268-1242/26/6/064002
Publikationsstatus	Veröffentlicht - 2011

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@article{14bca1a024484604a958d1b7d9fb6f35,

title = "X-ray characterization of semiconductor nanostructures",

author = "Vaclav Holy and Maja Buljan and Lechner, \{Rainer T.\}",

year = "2011",

doi = "10.1088/0268-1242/26/6/064002",

language = "English",

volume = "26",

pages = "064002/1-- 064002/7",

journal = "Semiconductor science and technology",

issn = "0268-1242",

publisher = "IOP Publishing Ltd.",

}

TY - JOUR

T1 - X-ray characterization of semiconductor nanostructures

AU - Holy, Vaclav

AU - Buljan, Maja

AU - Lechner, Rainer T.

PY - 2011

Y1 - 2011

U2 - 10.1088/0268-1242/26/6/064002

DO - 10.1088/0268-1242/26/6/064002

M3 - Article

SN - 0268-1242

VL - 26

SP - 064002/1- 064002/7

JO - Semiconductor science and technology

JF - Semiconductor science and technology

ER -